Contact type resistance measurementFully automatic (with sample transfer system) WS-8800 Fully automatic sorting system with transport robot by 4 point probe method WS-3000 Fully automatic measurement system for semiconductor process evaluation (thin film) by 4 point probe method RT-3000/RG-2000AL(RG-3000AL) Fully automatic system with one cassette station by 4 point probe method RT-3000/RS-1300 Global standard fully automatic measurement system in the flat panel field by 4 point probe method Product Information Contact type resistance measurement Manual (1 point measurement) Semi-automatic (Multi point measurement) Products Lineups Contact type resistance measurement Non-Contact type resistance measurement Lifetime measurement Flatness/Thickness measurement Spreading resistance measurement PN type checker 4 point probe head Resistivity Reference wafer
