RT-70V series
Simple measuring instrument of resistivity/sheet resistance by 4 point probe method
Selling Points
Combinational measurement system by Measurement tester(RT-70V) & Stage.
＜Measurement tester ; RT-70V＞
Thickness input with easy JOG dial operation (RT-70V Tester)
Tester self-test function/Auto change-over measurement range function
Measurement stage
1. RG-7C：Electric probe up-down stroke.
2. RG-5：Manual probe up-down stroke by handle lever.
3. RG-7S：Electric probe up-down stroke for Glass or Film sample using X-Y universal stage.
4.TS-7D：Hand held four point probe measurement instrument. *Stage plate is an option.
Details
Applications
- Semiconductor materilas, Solar-cell materials (Silicon, Polysilicon, SiC etc)
- New materials, functional materials (Carbon nanotube, DLC, graphene, Ag nanowire etc)
- Conductive thin film (Metal, ITO etc)
- Diffused sample (or layer)
- Silicon-related thin films (LTPS etc)
- Others (*Please contact us for details)
Sample sizes
*Depends on measurement stage.
Up to ＜Circle＞ 300mm(12 inch) or ＜Square＞ 730x920mm size.
Measuring range
[R] 1μ~3M Ω・cm
[RS] 5m~10M Ω/sq
Size
RT-70V:
W250 x D330 x H130mm
Approx. 7kg
